Parker DA-200 Contour Probe

The Parker Research DA-200 Contour Probe is a portable AC/DC magnetic inspection yoke used for magnetic particle inspection (MPI). It is designed to generate selectable alternating current (AC) and half-wave rectified direct current (DC) magnetic fields for surface and limited sub-surface defect detection on ferrous materials.

The DA-200 provides both AC and DC magnetic field modes in a single unit. The AC mode is used for surface defect detection and demagnetization after inspection, while the DC mode produces a half-wave rectified field for detecting some sub-surface discontinuities. The unit features fully adjustable articulating legs and a high-impact molded housing designed for industrial inspection use.

This contour probe is used in magnetic particle inspection and non-destructive testing (NDT) environments, including laboratories, manufacturing facilities, and field applications where flexible magnetic field selection is required for inspection of varying part geometries.

Available in Canada through Stuart Hunt & Associates.

SPECIFICATIONS

.

Features

• AC/DC magnetic yoke for MPI applications
• Selectable AC and half-wave rectified DC field modes
• Used for surface and limited sub-surface defect detection
• Fully adjustable articulating legs for varied geometries
• High-impact molded housing with IP51 rating

Parts Numbers Parts Numbers 115VAC - DA-200 Contour Probe

* Quantity

Request a quote Download Spec Sheet