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Parker DA-400 Contour Probe
The Parker Research DA-400 Contour Probe is a portable AC/DC magnetic inspection yoke used for magnetic particle inspection (MPI). It is designed to generate selectable alternating current (AC) and half-wave rectified direct current (DC) magnetic fields for detecting surface and limited sub-surface discontinuities in ferrous materials.
The DA-400 provides dual-mode magnetic field capability in a single self-contained instrument. The AC mode is used for surface defect detection and demagnetization after inspection, while the DC mode produces a half-wave rectified field for detection of some sub-surface defects. The unit includes solid-state electronics housed in a high-impact molded enclosure with articulating legs for adaptable positioning on complex part geometries.
This contour probe is used in magnetic particle inspection and non-destructive testing (NDT) environments, including industrial facilities, laboratories, and field inspection applications where portable AC/DC field selection is required.
Available in Canada through Stuart Hunt & Associates.
SPECIFICATIONS
|
Unit |
DA-400 |
DA-400S |
A-410 |
A-410S |
| Physical |
10 H × 8 L × 2.25 W |
|||
| Line Voltage Single Phase | 115 VAC 60 Hz |
230 VAC 50/60 Hz |
115 VAC 60 Hz |
230 VAC 50/60 Hz |
| Line Current | 6 A |
3 A |
6 A |
3 A |
| Duty Cycle |
50% |
|||
| Weight | 8.5 lbs (3.8 kg) | |||
| Construction |
Glass-filled nylon housing |
|||
| Span |
12 in. (305 mm) across poles |
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| Field | AC/DC | AC/DC | AC | AC |
.
Features
- AC/DC magnetic yoke for MPI applications
- Selectable AC and half-wave rectified DC field modes
- Used for surface and limited sub-surface defect detection
- Lightweight 8.5 lb portable design
- Articulating legs for adaptable inspection positioning
