Parker DA-400 Contour Probe

The Parker Research DA-400 Contour Probe is a portable AC/DC magnetic inspection yoke used for magnetic particle inspection (MPI). It is designed to generate selectable alternating current (AC) and half-wave rectified direct current (DC) magnetic fields for detecting surface and limited sub-surface discontinuities in ferrous materials.

The DA-400 provides dual-mode magnetic field capability in a single self-contained instrument. The AC mode is used for surface defect detection and demagnetization after inspection, while the DC mode produces a half-wave rectified field for detection of some sub-surface defects. The unit includes solid-state electronics housed in a high-impact molded enclosure with articulating legs for adaptable positioning on complex part geometries.

This contour probe is used in magnetic particle inspection and non-destructive testing (NDT) environments, including industrial facilities, laboratories, and field inspection applications where portable AC/DC field selection is required.

Available in Canada through Stuart Hunt & Associates.

SPECIFICATIONS

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Features

• AC/DC magnetic yoke for MPI applications
• Selectable AC and half-wave rectified DC field modes
• Used for surface and limited sub-surface defect detection
• Lightweight 8.5 lb portable design
• Articulating legs for adaptable inspection positioning

Parts Numbers Parts Numbers 115VAC - DA400 DA-400 Contour Probe

* Quantity

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