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Arjun 30 Flaw Detector

  • Weighs only 800g with battery
  • One-hand-operation
  • Only few keys for user friendly menu navigation
  • High resolution (800 x 480 pixels ) WVGA display
  • Removable Micro SD card up to 32GB
  • USB communication port
  • Auto plotting dynamic DAC
  • On Board DGS/AVG for defect size evaluation
  • Software for AWS D1.1 Sizing
  • Continuous/Dynamic A-Scan and B-Scan recording within the machine (up-to 100 hours in 8 GB Micro SD card)
  • Best for Documentation, Evidence, Analysis and Reporting
  • Real time color coded un-encoded B-Scan along with A-Scan on the screen
  • Square Wave Pulser
Technical Specifications
Test Range 2.5 mm to 10 meter (in steel). Fine mode adjustable in step of 1mm.
Velocity 1000 m/s to 15000 m/s. In Hot Key mode it has 21 pre-set values.Fine mode adjustable in step of 1 m/s.
Delay Up to 3 meter adjustable in 0.01, 0.1 or 1mm step.
Gain 100 dB calibrated gain adjustable in 0.1, 0.5, 1, 2, 6 or 14 dB step.
Rejection 0 to 125% FSH with LED indicator.
Rectification Full wave rectified with filtering.
Frequency 0.5 MHz to 15 MHz (Wideband).
Linearity deviation Vertical: ±3%, Horizontal: ±0.5%.
Test Modes Pulse echo and transmit/receive.
Probe Connectors LEMO Size 00 (2 no’s).
Monitor Dual gate adjustable in 1% of Screen width with Positive/Negative logic,
Gate Expand Gate Expand modes. Expands Range to width of the gate.
A-Scan memory 500 Trace Patterns can be stored, recalled or transferred to PC via USB port.A-Scan trace pattern can be directly stored on SD card or on External USB disk.
Calibration Set-up 50 different calibration set-ups can be Stored and Recalled.
Software ArjnSoft30 Interface software for Data transfer, Analysis, Reporting and Printing.
USB and SD card External USB disk and Micro SD card (up to 32GB) ports provided for data storage.
Display 5 inch Colour Wide VGA LCD/TFT display (800×480 pixel, size 108×64 mm) with higher resolution LCD for better signal representation and better visibility with different colour sets.
Reference A-Scan Reference A-Scan pattern of standard test object can be saved and recalled in the background for easy comparison during testing.
Echo Dynamic Echo Dynamic pattern display.
Dynamic DAC Dynamic DAC curve can be Digitally plotted (Smooth parabolic curve) on screen with selectable additional offset curves from 0 to 14 dB in 0.1 dB selectable steps.DAC curve can be set as flaw monitor gate can be plotted using minimum 2 to maximum 10 points.
DGS Defect size evaluation using predefined probe settings and custom probe set-ups,ERS (Equivalent Reflector Size) can also be displayed on the screen.
AWS Built in Software for Evaluation of defects in accordance with AWS Specification D1.1.
Built-In UT Data Recording Carries out 100 Hours of continuous /Dynamic A-Scan and B-Scan recording (in 8 GB SD Card) which can be replayed and analysed in Machine as well as PC.
Colour B-Scan Real time Colour coded Un-Encoded B-Scan along with A-Scan on the Screen which can be transferred to PC, Also analysis of A-Scan and B-Scan can be done in the machine as well as PC
Digital Readout And Trig. Function Thickness/Depth can be displayed in digital readout when using a normal probe and Beam path, Surface Distance and Depth are directly displayed when angle probe is in use.
Update Rate 50Hz.
Power Lithium-Ion Battery pack 7.4VDC, 5AH. External charger is provided to charge the battery without engaging the main unit.
Battery Life 8 Hours on Full Charge
Charger Input Voltage 100 to 240 VAC. Charge status indicator is provided.
Temperature 0 to 55°C.
Size 117 x 176 x 56 mm (HxWxD).
Weight 800 gms with Li-Ion Battery.
Compliance Ultrasound: EN 12668, ASTM E317
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